Our aspiration is that after reading this tutorial each practitioner will be able to perform error-free data analysis and draw meaningful insights from the rich well of XPS. What matters in the end is that the conclusions from the analysis can be trusted. Particular attention is paid to the correct workflow, development of good research practices, and solid knowledge of factors that impact the quality and reliability of the obtained information. 160 original spectra and over 290 references for further reading. At the same time, the majority of discussed topics is applicable to surface science in general and is, thus, of relevance for the analyses of any type of sample and material class. The analyses of thin film samples are chosen for model cases as this is from where the bulk of XPS reports presently emanate and also where the author's key expertise lies. The topic selection and the discussion level are intended to be accessible for novices yet challenging possible preconceptions of experienced practitioners. Six application examples highlight the broad range of research questions that can be answered by XPS. To counter that, we offer a comprehensive tutorial written in the form of a step-by-step guide starting from experimental planning, through sample selection and handling, instrument setup, data acquisition, spectra analysis, and results presentation. While there are many factors responsible for this situation, the lack of insight of physical principles combined with seeming ease of XPS operation and insufficient training are certainly the major ones. Should this trend continue, it would have disastrous consequences for scientific research. doi: 10.1007/s1177-8.There is a growing concern within the surface science community that the massive increase in the number of XPS articles over the last few decades is accompanied by a decrease in work quality including in many cases meaningless chemical bond assignment. Mechanical behavior and microstructural mechanism of improved disintegrated carbonaceous mudstone. Quantitative Investigation of Tomographic Effects in Abnormal Regions of Complex Structures. Epithermal Gold Deposits: Styles, Characteristics, and Exploration. Short-wave infrared (SWIR) reflectance spectrometric characterization of lays from geothermal systems of the Taupō Volcanic Zone, New Zealand/clays from geothermal systems of the Taupō Volcanic Zone, New Zealand. Structural Analysis of Interstratified Illite-Smectite by the Rietveld Method. X-ray diffraction gold epithermal deposits illite/smectite interlayered clays reflectance spectroscopy scanning electron microscopy. This work highlights the limits and advantages of three sensors (X-ray diffraction, scanning electron microscopy and reflectance spectroscopy) to investigate clay mixtures and interlayering, representing a significant contribution to confidence in the interpretation of interlayered clays, this being essential in mineral exploration and prospecting. This study shows that X-ray diffraction and validation with a scanning electron microscope is a mandatory, integrating tool for detecting interlayered phases since reflectance spectroscopy alone cannot be used to differentiate between interlayered clay minerals and non-interlayered mixtures. The two discrete phases were observed in both the whole rock analysis and in the extracted clay fraction. While spectroscopy indicated the occurrence of interlayered structures as a mixture of the two constituent minerals, the results of X-ray analysis showed that the interlayered clay consisted of two discrete phases (illite and smectite). X-ray diffraction results demonstrated the presence of an I/S peak at around 8.4° in the untreated fraction coupled with a peak splitting at 6.7° and 9.4° 2θ when solvated with ethylene glycol. For the first time, a precise determination of interlayered I/S conducted on the extracted clay fraction treated with ethylene glycol using such different approaches was provided. We investigated the occurrence of interlayered illite/smectite in a rock sample from Rodalquilar, Spain, using X-ray diffraction, scanning electron microscopy and reflectance spectroscopy in the short-wave infrared wavelength range. The overlap of peaks of the constituent minerals (e.g., illite and smectite), and the similarity of diffraction patterns when not treated with ethylene glycol, hampers identification, especially when the clay content is low. Accurate determination of clay minerals can be challenging due to the natural occurrence of interlayered phases, i.e., layers of different clay species such as illite and smectite.
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